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Advanced Scanning Probe Microscopy I www.nano4me.org © 2018 The Pennsylvania State University Advanced Scanning Probe Microscopy 1 Outline • Overview of Scanning Probe Techniques • Scanning Tunneling Microscopy • Atomic Force Microscopy –Hardware and Components –Tip/Sample Interactions –Common Modes of Operation –Pitfalls and Image Artifacts • Example of Instrument Operation www.nano4me.org © 2018 The Pennsylvania State University Advanced Scanning Probe Microscopy 2 Characterization on the Nanoscale • Using nanoscale materials and understanding them are two different things. • Modern tools help us to manipulate and characterize materials at the nanoscale. • Two notable innovations: FESEM: Field Emission Scanning Electron Microscopy “seeing” at the nanoscale SPM: Scanning Probe Microscopy (e.g., AFM) “feeling” at the nanoscale www.nano4me.org © 2018 The Pennsylvania State University Advanced Scanning Probe Microscopy 3 Timeline of Nanocharacterization 1987 Non-Contact AFM 1980 1986 1991 1993 Binnig and Rohrer Binnig, Quate, & Gerber Microfabricated IC-AFM STM Patent Contact Mode AFM Tips 1950 1960 1970 1980 1990 2000 2010 Nano gets HOT! 1933 1986 1988 1990 Ruska Ruska, Binnig, Computer Control Eigler and Schweizer SEM & Rohrer 1989 STM Manipulation Nobel Prize Optical Beam Bounce of Atoms Eng. & Sci. 2005, 1-2, 16 www.nano4me.org © 2018 The Pennsylvania State University Advanced Scanning Probe Microscopy 4
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