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Contents i CONTENTS ................................................................................ I INTRODUCTION....................................................................................... V HAPTER ECHNIQUES C 1 SPM T ............................................................... 1 1.1 Scanning Tunneling Microscopy.............................................................. 2 1.2 Atomic Force Microscopy........................................................................ 5 1.2.1Contact AFM................................................................................... 7 1.2.2Non-contact AFM.......................................................................... 10 1.2.3Intermittent-contact AFM.............................................................. 13 1.3 Magnetic Force Microscopy................................................................... 13 1.4 Lateral Force Microscopy.............................................................................. 15 1.5 Other SPM Techniques........................................................................... 17 1.5.1Force Modulation Microscopy....................................................... 17 1.5.2Phase Detection Microscopy ......................................................... 18 1.5.3Electrostatic Force Microscopy..................................................... 20 1.5.4Scanning Capacitance Microscopy................................................21 1.5.5Scanning Thermal Microscopy......................................................21 1.5.6Near-field Scanning Optical Microscopy......................................22 1.5.7Nanolithography ............................................................................ 22 1.6 SPMs as Surface Analysis Tools............................................................ 26 1.6.1Scanning Tunneling Spectroscopy.................................................26 1.6.2Force vs. Distance Curves.............................................................. 27 1.7 SPM Environments................................................................................. 30 1.7.1Ultra-high Vacuum........................................................................ 30 1.7.2Ambient.......................................................................................... 31 1.7.3Liquid............................................................................................. 31 1.7.4Electrochemical.............................................................................. 32 1.8 Further Reading...................................................................................... 32 ii Contents HAPTER HE CANNER C 2 T S ................................................................... 35 2.1 Scanner Design and Operation............................................................... 36 2.2 Scanner Nonlinearities............................................................................ 39 2.2.1Intrinsic Nonlinearity..................................................................... 39 2.2.2Hysteresis....................................................................................... 40 2.2.3Creep.............................................................................................. 42 2.2.4Aging.............................................................................................. 44 2.2.5Cross Coupling............................................................................... 46 2.3 Software Correction................................................................................ 48 2.4 Hardware Correction.............................................................................. 49 2.4.1Optical Techniques........................................................................ 51 2.4.2Capacitive Techniques................................................................... 51 2.4.3Strain-gauge Techniques................................................................ 51 2.5 Tests for Scanner Linearity .................................................................... 52 2.5.1Intrinsic Nonlinearity..................................................................... 52 2.5.2Hysteresis....................................................................................... 53 2.5.3Creep.............................................................................................. 53 2.5.4Aging.............................................................................................. 55 2.5.5Cross Coupling............................................................................... 56 2.5.6Step Profile: Hysteresis, Creep, and Cross Coupling in Z............56 2.6 Further Reading...................................................................................... 57 HAPTER ROBES C 3 SPM P ................................................................... 58 3.1 Introduction ............................................................................................ 58 3.2 Cantilevers.............................................................................................. 58 3.2.1Properties of Cantilevers................................................................ 59 3.3 Tip Shape and Resolution....................................................................... 60 3.4 How to Select a Probe ............................................................................ 65 3.5 Probe Handling....................................................................................... 69 3.6 Further Reading...................................................................................... 69 Contents iii HAPTER MAGE RTIFACTS C 4 I A .............................................................. 70 4.1 Tip Convolution...................................................................................... 70 4.2 Convolution with Other Physics............................................................. 73 4.3 Feedback Artifacts.................................................................................. 73 4.4 Image Processing Capabilities................................................................ 74 4.5 Test for Artifacts..................................................................................... 75 4.6 Further Reading...................................................................................... 75 HAPTER EY EATURES OF S C 5 K F SPM ................................................... 76 5.1 User Interface ......................................................................................... 76 5.2 Optical Microscope ................................................................................ 76 5.3 Probe Handling....................................................................................... 78 5.4 System Accessibility............................................................................... 78 Notes:..................................................................................................................... 1 iv Contents
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