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journal of industrial engineering international islamic azad university south tehran branch june 2009 vol 5 no 9 27 36 s raissi dep of industrial engineering islamic azad university south tehran ...

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                                         Journal of Industrial Engineering International                                                                                                                               Islamic Azad University, South Tehran Branch 
                                         June 2009, Vol. 5, No. 9, 27-36 
                                          
                                               	

	



	

	
		
	


                                                                                                                 




	



                                                                                                                                                                                            S. Raissi* 
                                                                             Dep. of Industrial Engineering, Islamic Azad University, South Tehran Branch, Tehran, Iran 
                                             Abstract 
                                                           Multivariate Process Capability Indices (MPCI) show how well a manufacturing process can meet specifica-
                                                      tion limits when quality characteristics enclose a relative correlation. Process capability is an important and 
                                                      commonly used metric for assessing and improving the quality of a production process. When quality charac-
                                                      teristics of a product are correlated then an attractive comes close to MPCI methods, which are not usually an 
                                                      easy task to carry out. In this investigation after a full reviewing of the MPCI, a simple method to estimate 
                                                      product capability indices based on ridge regression models in the presence of priority for quality characteris-
                                                      tics is presented. The technique is demonstrated for evaluation of product capability through the use of an ex-
                                                      ample which shows performance of the proposed method. 
                                                       
                                                      Keywords: Multivariate process capability indices; Product capability; Ridge regression method; Quality 
                                                      characteristic priority; Multivariate statistical process control 
                                    
                                    
                                   1. Introduction                                                                                                                                                                       which  are  effective  tools  for  quality  assurance. 
                                                                                                                                                                                                                         These indices are defined as: 
                                         Process produces products according to a certain                                                                                                                                        
                                   quality  characteristic,  for  example  weight,  length,                                                                                                                                                     USL−LSL
                                                                                                                                                                                                                                C =                                               i        
                                   hardness,  viscosity,  etc.  The  degree  a  process  is                                                                                                                                          P                         6σ
                                   producing  data  within  tolerance  limits,  can  be                                                                                                                                          
                                   measured using Process Capability Indices (PCIs).                                                                                                                                                                                 USL −µ µ−LSL
                                                                                                                                                                                                                                C              =Min                                              ,                            
                                   PCIs are generally used in industry to measure cha-                                                                                                                                               PK                                       3σ                            3σ               
                                   racteristics that are independence of each others. A                                                                                                                                                                                                                                      
                                   standard  practice  in  Statistical  Process  Control                                                                                                                                         
                                   (SPC) programs is to ensure that the process is un-                                                                                                                                          C               =            USL−LSL                                           i =1, 2, ..., p            (1) 
                                                                                                                                                                                                                                     PM                            2                              2
                                   der statistical control prior to conducting a process                                                                                                                                                              6 σ +(µ−T)
                                   capability  analysis.  Unfortunately,  it  is  a  fairly                                                                                                                                      
                                   common  practice  to  perform  capability  analysis                                                                                                                                                                                                                                                                                        
                                   using  a  sample  of  historical  process  data  without                                                                                                                                     C                  =Min                             USL−µ                                 ,              µ−LSL                                 
                                                                                                                                                                                                                                     PMK                                                                                                                                      
                                   any consideration of whether or not the process is in                                                                                                                                                                              3 σ2+(µ−T)2 3 σ2+(µ−T)2 
                                                                                                                                                                                                                                                                                                                                                                              
                                   statistical  control.  As  Montgomery  [25]  stated,  if                                                                                                                               
                                   the process is not in control then its parameters are 
                                   unstable and the value of these parameters in the                                                                                                                                     where USL and LSL are the upper and the lower 
                                   future is uncertain. Hence, the predictive aspects of                                                                                                                                 specification limits, respectively,  µ  is the process 
                                   the process capability indices regarding the number                                                                                                                                   mean, σ  is the process standard deviation and T is 
                                   of nonconforming items produced are lost.                                                                                                                                             target  amount  anywhere  within  the  specification 
                                         The most frequently used univariate PCIs includ-                                                                                                                                interval. 
                                   ing C , C , C , and C                                                                 have been proposed in                                                                                  PCIs  have  recently  received  a  considerable 
                                                    P           PK              PM                            PMK
                                   the  manufacturing  industry  to  provide  numerical                                                                                                                                  amount of attention in the literature of SPC. Nu-
                                   measures  on  process  capability  and  performance,                                                                                                                                  merous authors including Kane [20], Marcucci and  
                                                                                                                                                                                                                          
                                            
                                     * Corresponding author. E-mail: raissi@azad.ac.ir 
                                                                    
                                                            
                                                  
                                                 









                                                 

                                                                                                                                                                                                                                                                                                      
                                                 Beazley [24],Chan and Cheng [3], Choi and Owen                                                                                                                                                                                                                      2. Some techniques in MPCIs evaluations  
                                                 [8], Spiring [37],Koons [21],Wheeler and Cham-
                                                 ber [43], Pearn [32], Bissel [2], Wright [45], Pearn                                                                                                                                                                                                                           Various  authors  have  proposed  alternative  ap-
                                                 and Chen [29], Stoumbos [38], Pearn and Shu [33],                                                                                                                                                                                                                    proaches to assess process capability in multivariate 
                                                 Chen and Chen [6], Perakis and Xekalaki [34] and                                                                                                                                                                                                                     environment. Taam et al. [39] recommend using a 
                                                 Chou et al. [10] have discussed theories and appli-                                                                                                                                                                                                                  multivariate  capability  index  that  is  defined  as  a 
                                                 cations of univariate PCIs, when process normally                                                                                                                                                                                                                    ratio of two volumes: 
                                                 distributed.                                                                                                                                                                                                                                                                    
                                                           Extensive studies have also been conducted to de-                                                                                                                                                                                                                                                                 Vol.(R )
                                                                                                                                                                                                                                                                                                                                  MC =                                                                      1                                                                            (2) 
                                                 termine the effects of non-normality on the various                                                                                                                                                                                                                                                PM                       Vol.(R )
                                                 PCIs.  Gunter  [13,14,15,16]  in  a  series  of  articles                                                                                                                                                                                                                                                                                                  2
                                                 pointed out many flaws of the indices particularly                                                                                                                                                                                                                              
                                                                                                                                                                                                                                                                                                                      where R  is a modified tolerance region and R  is a 
                                                 C  when applied  to  non-normal  data.  Interested                                                                                                                                                                                                                                                        1                                                                                                                                                                      2
                                                        PK
                                                 readers  are  referred  to  Munechika  [26],  Clemets                                                                                                                                                                                                                scaled 99.73 percent process region. In particular, if 
                                                 [11],  Wright  [44],  Somerville  and  Montgomery                                                                                                                                                                                                                    the process data are multivariate normal, then R2 is 
                                                 [36],  Bai  and  Choi  [1],  Chen  and  Ding  [7]  and                                                                                                                                                                                                               an elliptical region. A process region and modified 
                                                 Chou et al. [9] for more discussions on the univa-                                                                                                                                                                                                                   tolerance region is shown in Figure 1 at appendix. 
                                                 riate process capability indices when normality as-                                                                                                                                                                                                                  The  modified  tolerance  region  is  defined  as  the 
                                                 sumption is violated.                                                                                                                                                                                                                                                largest ellipsoid that is centered at the target com-
                                                           During the past decade, there has been a growing                                                                                                                                                                                                           pletely located inside the original tolerance region. 
                                                                                                                                                                                                                                                                                                                      The estimate for MC                                                                                  is given by: 
                                                 concern about the normality and independence as-                                                                                                                                                                                                                                                                                                               PM
                                                 sumptions required to compute univariate capability                                                                                                                                                                                                                   
                                                 indices.  In  practice,  it  is  common  to  use  two  or                                                                                                                                                                                                                                                                       ˆ
                                                                                                                                                                                                                                                                                                                                              ˆ                               CP
                                                 more related quality characteristics of a product to                                                                                                                                                                                                                             MCPM = ˆ                                                                                                                                                            (3) 
                                                 evaluate  the  performance  of  a  manufacturing                                                                                                                                                                                                                                                                                 D
                                                 process. Since the early work of Hotelling [17], it                                                                                                                                                                                                                   
                                                 has become evident that such problems, due to the                                                                                                                                                                                                                    where, 
                                                 correlation that exists among quality characteristics,                                                                                                                                                                                                                          
                                                 need to be addressed in multivariate context to en-                                                                                                                                                                                                                        ˆ                                                                         Vol.(tolerance region)
                                                                                                                                                                                                                                                                                                                       CP =
                                                 sure  proper  evaluation.  Similar  to  the  univariate                                                                                                                                                                                                                                         Vol.(estimated                                                                   99.73% of  process region)
                                                 case,  the  Multivariate  Process  Capability  Indices                                                                                                                                                                                                                                                       Vol.(tolerance region)
                                                 (MPCIs) have also captured attentions of many re-                                                                                                                                                                                                                             =                                                                       ν                                                                  −1                                                               (4)
                                                                                                                                                                                                                                                                                                                                                                  1                                                                ν
                                                 searchers including Hubele et al. [19], Chan et al.                                                                                                                                                                                                                                                    S 2(πK) 2 Γ(                                                                               +1)	
                                                 [4],  Taam et al. [39], Nickerson [27], Chen [14],                                                                                                                                                                                                                                                                                                                 
                       2                        
                                                 Karl et al. [23], Niverthi and Dey [28], Shahriari                                                                                                                                                                                                                                                                                                                                                                                                                                    
                                                 et  al.  [35],  Wang et al. [42], Wang and Du [40],                                                                                                                                                                                                                  and, 
                                                 Frey et al. [12], Wang and Hubele [41], Pearn et al.                                                                                                                                                                                                                            
                                                 [31]  and  Pearn  and  Chien-Wei  [30].  For  a  quick                                                                                                                                                                                                                                                                                                                                                                                                 1
                                                                                                                                                                                                                                                                                                                                     ˆ                                             n                                                    ′          −1                                            	2
                                                 survey and interpretations on univariate and multi-                                                                                                                                                                                                                                                                                               (                                   )                    (                                  )
                                                                                                                                                                                                                                                                                                                                  D= 1+                                                                X−0 S X−0                                                                                                      (5) 
                                                                                                                                                                                                                                                                                                                                                        
                    n−1                                                                                                                  
                                                 variate  process  capability  indices  see  Kotz  and                                                                                                                                                                                                                                                  
                                                                                                                                         
                                                 Johnson [22].                                                                                                                                                                                                                                                         
                                                           An existing serious problem in multivariate quali-                                                                                                                                                                                                         where K is the 99.73 percent quantile of a  χ 2 dis-
                                                 ty control is in complexity of methodology for as-                                                                                                                                                                                                                                                                                 S
                                                 sessing MPCIs. The purpose of this paper is to pro-                                                                                                                                                                                                                  tribution and                                                             denotes the determinant of sample 
                                                 vide a relatively simple method for estimating the                                                                                                                                                                                                                   variance-covariance matrix. 
                                                 most  well-known  relevant  PCIs  (priory  showed                                                                                                                                                                                                                              Shahriari et al. [35] proposed a vector consisting 
                                                 through set of Eq. (1) in multivariate environment                                                                                                                                                                                                                   of three components. The first two components use 
                                                 which  define  by  MC ,  MC ,  MC                                                                                                                                      ,  and  MC                                                                                    the assumption that the process data is from a mul-
                                                                                                                                                 P                           PK                               PM                                                     PMK
                                                 respectively. A brief discussion to some MPCIs is                                                                                                                                                                                                                    tivariate normal distribution with elliptical contours 
                                                 presented in Section 2 and the proposed methodol-                                                                                                                                                                                                                    defining probability regions and the third compo-
                                                 ogy to estimate MPCIs are offered in Section 3. The                                                                                                                                                                                                                  nent  is  based  on  a  geometric  understanding  of 
                                                 fourth part discusses a numerical example.  Conclu-                                                                                                                                                                                                                  process  relative  to  the  engineering  specifications. 
                                                 sions are provided in the final section.                                                                                                                                                                                                                             The first component is defined as: 
                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                       
                   
                 
                 
                                                                     





	

	



	

	
		
	












              

                                                                         1            F         denotes the value of F distribution with 
                            vol. of engineering tolerance region	ν                     (ν ,n−ν )
                 MCPM =
                                                          ν and n-ν degrees of freedom. It should be pointed 
                            
   vol. of modified process region                   out that large values of PV indicate the closeness of 
                                                    1                              the center of the process to the pre-specified target 
                            ν                    	ν
                           
∏(USL −LSL )                                          value.  
                                       i       i                                      The third component of the vector that is referred 
                            = 
 i =1                  i =1,2,...,ν    (6)
                           
 ν                                                    to as location index (LI) compares the location of 
                           
∏(UPLi −LPLi)                                         the modified process region to the tolerance region. 
                           
 i =1                                                 This index has a value of one if the entire modified 
                                                                                   process region is contained within the tolerance re-
                Figure 2 at appendix illustrates their method for a                gion indicating that all the manufactured products 
              product in which the engineering specifications de-                  conform to the specification limits, otherwise it will 
              fine  a  rectangular  tolerance  region  but  bi-variate             take a value of zero.   
              normal process variables define an elliptical proba-                    Chen [5] proposed a multivariate process capabil-
              bility  contour referred to as process region. Their                 ity  index  based  on  a  multiple  bilateral  tolerance 
              proposed method forms a modified process region                      zone defined by: 
              by drawing the smallest rectangle around the ellip-                      
              tical  process  region.  The  edges  of  the  modified                        {        V                                  }
                                                                                      V = X∈R : X − ≤r,i=1,2,....,v (11) 
              process region are defined as the lower and upper                                             i     0     i
              process limits (LPLi and UPLi, respectively, where                    
              i=1,2,…ν) and are given by:                                          where  µ is the specification limit and  r  is a con-
                                                                                              0i                                   i
                                                                                   stant.  The multivariate process capability index is 
                                   χ2 −1                                          given by MC = 1 , where r is defined such that: 
                UPL =µ +             ν,α   i                                                       P      r
                      i      i        −1                                    (7) 
                                                                                       
                                                                                               X −                           
                                                                                                   i    0
                                                                                                       i                      
                                     2     −1                                         P Max                r ,i =1,2,...,v ≤r =1−α (12) 
                                   χ                                                                     i                   
                                     ν,α   i                                                                                  
                 LPL =µ −                         ;  i = 1,2,...,ν       (8) 
                      i     i         −1                                              
                                                                                      Let F be the cumulative distribution function of, 
                          2                                  α                         
              where  χν,α denotes  the  upper  100(            )  %  of                               X −                            
                                                                                                       i      0                       
              aχ2distribution  with  ν  degrees  of  freedom  and                   h(X− )=Max                 i    ≤r,i=1,2,....,v    (13) 
                                                                                            0                    r     i              
                                                                                                                  i                   
                 −1                                                                                                                   
              i     is the determinant of the variance-covariance                     
              matrix with its ith row and column deleted.                                           −1                               MC
                                                                                      Then  r = F (1−α).  If  the  value  of              P  is 
                The second component of the proposed vector is                     greater  than  or  equal  to  1,  the  process  is  capable 
              based on the assumption that the center of the speci-                with a certain confidence level. 
              fication limits denotes the process mean. This com-                     Frey [12] proposed a matrix of dimensionless pa-
              ponent is defined as the significance level of a Ho-                 rameters (C), which represents a linear mapping of 
              telling’s T 2 statistic, which is computed as follows: 
                                                                                   noise variables (nj ; j=1,2,…,n) to quality characte-
                                                                                   ristics (qi ; i=1,2,…,m), for evaluating process ca-
                             2    ν(n−1)                                         pability in multivariate environment. The elements 
                 PV = PT ≥                   F                        (9) 
                                     n−ν        (ν ,n−ν )                          of this matrix, C , are defined as: 
                                                                                                    ij
                                                                                       
              where,                                                                              ∂q       
                                                                                              6Sj          
                                                                                                  ∂n       
                                   ′  −1                                                               n=t ij
                T2 = n(X − ) S (X − )                      (10)                     C =                                                       (14) 
                                0                0                                       ij   USL −LSL
                                                                                                    i        i
                                                                                       
                                                                                    
                                                                                                                                            
                                                                    
                                                            
                                                  
                                                 









                                                 

                                                                                                                                                                                                                                                                                                      
                                                                                                                                                                                                                                                                                                                       
                                                  
                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                               
                                                                                                                 Figure 1. Typical modified tolerance region (R1) versus estimated 99.73 % process region (R2) in a bivariate case. 
                                                  
                                                  
                                                  
                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                     
                                                                                                                                                                                Figure 2. Rectangular Tolerance Region versus Modified Process Region. 
                                                                                                                                                                                                                                                                                                                       
                                                                                                                                                                                                                                                                                                                       
                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                                       
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...Journal of industrial engineering international islamic azad university south tehran branch june vol no s raissi dep iran abstract multivariate process capability indices mpci show how well a manufacturing can meet specifica tion limits when quality characteristics enclose relative correlation is an important and commonly used metric for assessing improving the production charac teristics product are correlated then attractive comes close to methods which not usually easy task carry out in this investigation after full reviewing simple method estimate based on ridge regression models presence priority characteris tics presented technique demonstrated evaluation through use ex ample shows performance proposed keywords characteristic statistical control introduction effective tools assurance these defined as produces products according certain example weight length usl lsl c i hardness viscosity etc degree p producing data within tolerance be measured using pcis min generally industry me...

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